Techniques for Analyzing Solid Dispersed Systems (P2): Scanning Electron Microscopy (SEM) & Transmission Electron Microscopy (TEM)
Electron microscopy is an advanced imaging technique with high magnification capabilities, using an electron beam as the light source instead of visible light, as in optical microscopy. In electron microscopy, the focused electron beam interacts with the sample surface, leading to various forms of interaction between the beam and the